Method and apparatus for testing a memory device

专利名称：Method and apparatus for testing a memory

device

发明人：Katsutoshi Suitou,Yoshichika Nakaya申请号：US11362318申请日：20060223公开号：US07352638B2公开日：20080401

专利附图：

摘要：The extension sector enable signal RS_SEL is a test target control signal forswitching a test target between ordinary sectors and redundant sectors. During the testperiod of redundant sectors, if the defective redundant sector signal RSECF is at a HIGH

level (that is, the selected redundant sector is a defective sector), the compulsory signalFMATCH is brought to a HIGH level. The match signal MATCH is forcedly brought to aHIGH level (S) in compliance with the compulsory signal FMATCH which is at a HIGH level(S:T). And, verification (S) is skipped for the defective sectors, whereby the address signalfor identifying the ordinary memory blocks may be utilized for identification ofredundant memory blocks.

申请人：Katsutoshi Suitou,Yoshichika Nakaya

地址：Kawasaki JP,Kawasaki JP

国籍：JP,JP

代理机构：Ingrassia, Fisher & Lorenz, P.C.

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