Leakage current testing circuit

专利名称：Leakage current testing circuit发明人：George F. Charette申请号：US06/004322申请日：19790117公开号：US04292585A公开日：19810929

摘要：A three wire leakage current testing circuit for determining the operationalperformance of ground fault circuit interrupter devices has parallel tripping leadsconnected to the output of a potentiometer adjustable to line voltage. One lead includesresistors, a potentiometer adjustable within a selected milliampere range and amilliammeter. The other lead has a timer the readout of which is digital and in terms ofmilliseconds. The leads are switch controlled so that one lead may be closedindependently of the other or both leads may be closed simultaneously. The testingcircuit may be plugged into or connected to an energized ground fault interrupterreceptacle or circuit breaker and it includes switch controlled leads in which an externalground fault circuit interrupter device may be incorporated, the testing circuit thenplugged into a conventional three wire outlet. The circuit also includes a section enablingother tests to be made such as voltage, polarity, circuit ground resistance and leakagetests to be made of a portable tool.

申请人：CHARETTE; GEORGE F.

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